CTL for Test Information of Digital ICS CTL (proposed standard as IEEE 1450.6, Core Test Language) is a language that has many possible applications in the area of test. The language reuses syntax defined by IEEE 1450 and IEEE 1450.1 and was created primarily for the proposed IEEE 1500 standard. As it can be seen, CTL is a language with a conglomeration of concepts that is spread thin across multiple documents. As a result I saw a need to put the basic concepts of CTL in a single location

基于C#编写的stil仿真文件转V50_Pattern,I2C操作以及SPI读写flash转V50 pattern，适用于IC测试行业将测试配置转换成ATE测试pattern，大大缩减工作量

STIL格式的仿真文件的详细描述，文件格式定义，以及语法规则

Standard Test Interface Language (STIL) for Digital Test Vectors原版

STIL IEEE STD 1450-1999.rar

IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450™1999) for Semiconductor Design Environments

Standard Test Interface Language manual 1996年版的

Standard Test Interface Language (STIL) is a standard language that provides an interface between digital test generation tools and test equipment. STIL may be directly generated as an output language of a test generation tool, or it may be used as an intermediate format for subsequent processing.